Single Image Re ection Removal via Deep Feature Contrast

Author: Lumin Liu

Abstract: Removing undesired re ection from a single image is in demand for computational photography. Re ection removal methods are gradually effective because of the fast development of deep neural networks. However, current results of re ection removal methods usually leave salient re ection residues due to the challenge of recognizing diverse re ection patterns. In this paper, we present a one-stage re ection removal framework with an end-to-end manner that considers both low-level information correlation and efficient feature separation. Our approach employs the criss-cross attention mechanism to extract low-level features and to efficiently enhance contextual correlation. To thoroughly remove re ection residues in the background image, we punish the similar texture feature by contrasting the parallel feature separa- tion networks, and thus unrelated textures in the background image could be progressively separated during model training. Experiments on both real-world and synthetic datasets manifest our approach can reach the state-of-the-art effect quantitatively and qualitatively.

Pages: 311-320

DOI: 10.46300/9106.2022.16.38

International Journal of Circuits, Systems and Signal Processing, E-ISSN: 1998-4464, Volume 16, 2022, Art. #38